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186 eV Resolution
All solid state design...
No more liquid nitrogen!

The XR-100CR represents a breakthrough in x-ray detector technology by providing "off-the-shelf" performance previously available only from expensive cryogenically cooled systems.


Features

  • Si-PIN Photodiode
  • Thermoelectric Cooler
  • Temperature Monitor
  • Beryllium Window
  • Hermetic Package (TO-8)
  • Wide Detection Range
  • Easy to Operate

Additional Information

Applications

x-ray detector element

Model XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an x-ray detector. Also mounted on the cooler are the input FET and a novel feedback circuit. These components are kept at approximately -30 °C, and can be monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight 1 mil (25 µm) Beryllium window to enable soft x-ray detection.

Power to the XR-100CR is provided by the PX2CR Power Supply. The PX2CR is AC powered and also includes a spectroscopy grade Shaping Amplifier. The XR-100CR/PX2CR system ensures stable operation in less than one minute from power turn-on.

The resolution for the the 5.9 keV peak of  55Fe is 220 eV FWHM with 12µs shaping time constant (standard) and 186 eV FWHM with 20µs shaping time (optional).

XR-100CR x-ray detector resolution

Theory of Operation

X rays interact with silicon atoms to create an average of one electron/hole pair for every 3.62 eV of energy lost in the silicon. Depending on the energy of the incoming radiation, this loss is dominated by either the Photoelectric Effect or Compton scattering. The probability or efficiency of the detector to "stop" an X-Ray and create electron/hole pairs increases with the thickness of the silicon. See Figures 2 and 3.

In order to facilitate the electron/hole collection process, a 100 volt bias voltage is applied across the silicon. This voltage is too high for operation at room temperature, as it will cause excessive leakage, and eventually breakdown. Since the detector in the XR-100CR is cooled, the leakage current is reduced considerably, thus permitting the high bias voltage. This higher voltage decreases the capacitance of the detector, which lowers system noise.

Electron-hole pairs created by X-Rays which interact with the silicon near the back contact of the detector are collected more slowly than normal events. These events result in smaller than normal charge collection and can increase the background in an energy spectrum and produce false peaks. Such events are characterized by slow risetime, and the PX2CR Amplifier incorporates a Rise Time Discrimination circuit (RTD) which prevents these pulses from being counted by the MCA. See figure 6. All spectra shown in this specification were taken using RTD.

XR-100CR x-ray detector RTD vs. no RTD
Figure 6. RTD vs. No RTD

The thermoelectric cooler cools both the silicon detector and the input FET transistor to the charge sensitive preamplifier. Cooling the FET reduces its leakage current and increases the transconductance, both of which reduce the electronic noise of the system.

Since optical reset is not practical when the detector is a photodiode, the XR-100CR incorporates a novel feedback method for the reset to the charge sensitive preamplifier. The reset transistor, which is typically used in most other systems has been eliminated. Instead, the reset is done through the high voltage connection to the detector by injecting a precise charge pulse through the detector capacitance to the input FET. This method eliminates the noise contribution of the reset transistor and further improves the energy resolution of the system.

A temperature monitor chip is mounted on the cooled substrate to provide a direct reading of the temperature of the internal components, which will vary with room temperature. Below -20 °C, the performance of the XR-100CR will not change with a temperature variation of a few degrees. Hence, closed loop temperature control is not necessary when using the XR-100CR at normal room temperature.

Vacuum Operation

The XR-100CR can be operated in air or in vacuum down to 10-8 Torr. There are two ways the XR-100CR can be operated in vacuum: 1) The entire XR-100CR detector and preamplifier box can be placed inside the chamber. In order to avoid overheating and dissipate the 1 Watt of power needed to operate the XR-100CR, good heat conduction to the chamber walls should be provided by using the four mounting holes. An optional Model 9DVF 9-Pin D vacuum feedthrough connector on a Conflat is available to connect the XR-100CR to the PX2CR outside the vacuum chamber. 2) The XR-100CR can be located outside the vacuum chamber to detect X-Rays inside the chamber through a standard Conflat compression O-ring port. Optional Models EXV6 / EXV9 (6 or 9 inch) vacuum detector extenders are available for this application. See photograph of XR-100CR with extender and Conflat and components for vacuum applications.


XR-100CR x-ray detector multi-element fluorescence spectrum
Figure 1. Sample Spectrum

XR-100CR Specifications

General
Detector TypeSi-PIN
Detector Size2.4 x 2.8 mm (7 mm2), standard
Silicon Thickness300 µm. See Figures 2 and 3
Energy Resolution @ 5.9 keV (55Fe)

220 eV FWHM with 12 µs shaping time (standard)
186 eV FWHM with 20 µs shaping time (optional)
280 eV FWHM with 6 µs shaping time(optional)

Background counts<3 x 10-3/s, 2 keV to 150 keV
Detector WindowBe, 1 mil thick (25 µm) See Figures 2 and 3
Charge Sensitive PreamplifierAmptek custom design with reset through the H.V. connection
Case Size3.75 x 1.75 x 1.13 in (9.5 x 4.4 x 2.9 cm)
Weight4.4 ounces (125 g)
Total Power<1 Watt

Inputs
Test Input1 mV/keV, positive
Preamp Power±9 V @ 15 mA
Detector Power+100 V @ 1 µA
Cooler Powercurrent = 0.7 A maximum, voltage = 2 V maximum

Outputs
Preamplifier Sensitivity1 mV/keV
Preamplifier PolarityNegative signal output (1 kohm maximum load)
Preamplifier FeedbackReset through the detector capacitance
Temperature Monitor Sensitivity1 µA corresponds to 1 °K

Options

Connectors

Preamp OutputBNC coaxial connector
Test InputBNC coaxial connector
Other connections6-Pin, LEMO connector with 5 ft cable

6-Pin LEMO Connector

Pin 1Temperature monitor
Pin 2+H.V. Detector Bias, +110 V maximum
Pin 3-9 V Preamp power
Pin 4+9 V Preamp power
Pin 5Cooler power return
Pin 6Cooler power (0 to +2.1 V @ 0.7 A maximum)
CaseGround and shield

Model PX2CR

Power Supply & Shaping Amplifier

General

Size: 6 x 6 x 3.5 in (15.3 x 15.3 x 8.9 cm)
Weight: 2.5 lbs (1.15 kg)

Input AC power to the PX2CR is provided through a standard IEC 320 plug (110/250 VAC, 50-60 Hz). See Figure 5.

The four (4) DC Voltages needed to operate the XR100CR are supplied through a female 9-Pin D-Connector on the PX2CR. The Pin list to this connector is given below. The multiconductor cable which connects the PX2CR to the XR-100CR is provided with the system.

9-Pin D-Connector

Pin 1+9 V Preamp power
Pin 2-9 V Preamp Power
Pin 30 to +3 V Cooler Power @ 0.7 A maximum
Pin 4+9 V Temperature Monitor Power
Pin 5+H.V. Detector Bias, +110 V maximum
Pin 6Ground and case
Pin 7Cooler power return
Pin 8Ground and case
Pin 9Ground and case

PX2CR Shaping Amplifier Specifications

PolarityPositive unipolar
Shaping Time12 µs standard (6 and 20 µs optional)
Pulse Width22 µs. See Figure 4.
Shaping Type7 pole "Triangular" with base line restoration, rise time discrimination (RTD), and pileup rejection.
Sensitivity0 to 1 V/keV (10 turn pot)
Gain0 to X1000
Gain ShiftSee figure 15
Output Impedance< 1 ohm

The output pulse produced by the PX2CR Shaping Amplifier is optimum for most applications using the Si-PIN photodiode detectors, and can be connected directly to the input of a Multichannel Analyzer (MCA). For optimum portability and versatility, use the Amptek MCA8000A "Pocket MCA" with over 16k data channels.

Signal Connections

Input from XR100CRFront Panel BNC
Output to MCAFront Panel BNC
Pileup Rejection (PU)Rear Panel BNC, Positive TTL
For the duration of this output gate, any detected pulse must be rejected by the MCA
Input Count Rate (ICR)Rear Panel BNC, Positive TTL <2 µs
When connected to a counter the ICR countrate corresponds to the total number of X-Ray events that strike the detector.

This diagram shows the internal connections between the AXRCR hybrid sensor and the electronics within the case, as well as the external connections to the PX2CR.

XR-100CR x-ray detector system block diagram
Figure 5. XR-100CR Connection Diagram


Figures and Additional Information

PX2CR amp out pulse shape
Figure 4. PX2CR Amplifier Output (12µs shaping time)
Shaping Time ConstantPulse Width
Standard 12 µs22 µs FWHM
Optional 6 µs15 µs FWHM
Optional 20 µs54 µs FWHM
XR-100CR x-ray detector sample spectrum
Figure 13. Sample Spectrum
XR-100CR x-ray detector output vs. input count rate
Figure 16. Output vs. Input Rate for different Shaping Time Constants
XR-100CR x-ray detector peak shift/resolution vs. count rate
Figure 15. Resolution and Peak Shift vs. Count Rate

NOTE: The XR-100CR has replaced the XR-100T

See also the XR-100T-CZT Cadmium Zinc Telluride (CZT) detector for high efficiency and high resolution Gamma Ray detection.

XR-100CR Specifications in PDF (382k)

All spectra taken with Amptek MCA8000A multichannel Analyzer.


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Revised February 9, 2001